Nanoscale mapping of dielectric properties based on surface adhesion force measurements

• Ying Wang,
• Yue Shen,
• Xingya Wang,
• Zhiwei Shen,
• Bin Li,
• Jun Hu and
• Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

• : adhesion; atomic force microscopy (AFM); graphene oxide (GO); nanoscale dielectric properties; reduced graphene oxide (RGO); Introduction The local dielectric distribution is a key factor that influences the physical properties and functionalities of various materials such as polymer nanocomposites [1][2